Working efficiently with a system


ZEISS Inspect / GOM ATOS In-depth Seminar

Optimize pre-series measurement with ATOS – make optical 3D measurement comparable with CMM

Practical 3D measurement technology training

directly in your company

Safer, faster, more efficient: Get yourself and your team ready for ZEISS Inspect / GOM

How can measurement results from optical 3D measurement technology using the GOM ATOS be reliably compared with a coordinate measuring machine?


 This is precisely where our advanced seminar for ZEISS Inspect / GOM comes in.


 This training is aimed at companies that want to accelerate their pre-series measurements, implement tool corrections more quickly, and simultaneously ensure comparable measurement results between optical and tactile measurements. We conduct the training at your company – hands-on, using your existing system, peripheral devices, and components.


MICHAEL RAY

Managing Director & Training Manager

 I look forward to working with you to get the most out of your system. Schedule your personal training appointment!

Training content (individually tailored)

  • Analysis of the existing measurement strategy → Goal: Comparability between optical and tactile measurement
  • Measurement description as the basis for evaluation → Transfer of the CMM logic to ZEISS Inspect
  • Element formation according to the CMM principle → planes, lines, circles, cylinders, etc. via defined points instead of automatic elements.
  • Comparable evaluation methodology → Identical reference systems and evaluation principles as on the CMM
  • Efficient point strategy → Use of auxiliary geometries for targeted point generation
  • Targeted use of cluster function → Reduction of effort for recurring geometries
  • User-defined inspection principles → Standardization and acceleration of evaluation
  • Handling repetitive design elements → Fast creation through intelligent preparation
  • Pattern exports & further processing → e.g. export of individual patterns in .IGES format

Case study

This is how a recent seminar went

The customer: “Toolmaking and design require fast, valid measurement results and CAD-compatible data. In series production, measurements are taken on a CMM – the optical system is significantly faster, but the strategy differs. How do we make the results comparable?”


The following optimizations were implemented in the actual process:

  • Adaptation of the evaluation to the CMM measurement description
  • Construction elements consistently built up via defined points
  • Using the cluster function for significant time savings
  • Use of auxiliary geometries for structured point generation
  • Introduction of user-defined inspection principles
  • Export of sections in .IGES format for construction purposes


 Result: The deviations between optical and tactile measurements were almost consistently in the micrometer range. The design team was able to directly use the data – particularly thanks to the precise cross-sectional exports.

AM Raylike

Why choose us?

From designers for metrology technicians – practical & efficient

  • On-site seminar
  • We build directly on your existing knowledge.
  • Experienced designer and measurement technology user as trainer
  • Measurement and evaluation on real components
  • Customized handout based on your data
  • Group seminars for the entire team are possible.
  • Further support: process guidance, in-depth training, ZEISS / GOM programming (see also advanced seminar)

What we need from you in advance

To ensure the training is optimally prepared, we clarify the following in advance, among other things:


  • Which ZEISS Inspect version is being used?
  • Example file of a component (ideally as .STEP)
  • Measurement strategy: Drawing tolerances or pass/fail evaluation?
  • Existing measurement description (CMM evaluation)
  • Are components measured repeatedly? (e.g., in a phased project)
  • Are there report templates available?
  • Further processing of the data (CSV, .IGES etc.)

General questions

Hello. Here you'll find more key points on the topic:

  • How long does the seminar last?

    Individual – usually 1–3 days, depending on complexity and objective.

  • Who is this seminar suitable for?

    For metrologists with experience in ZEISS Inspect or GOM ATOS.

  • What is the difference to the classic GOM training?

    Focus on comparability with CMMs and real pre-series processes.

  • Why do optical and tactile measurement results often differ?

    Besides differing measurement strategies, the main cause is the discrepancies in measurement technology. This seminar shows you how to standardize your methodology and minimize deviations.

  • Isn't the additional effort required by defining points too high?

    Yes, the initial effort is higher. However, in the seminar we will show you how to significantly speed up the process again using cluster functions and inspection principles.

  • Can the seminar be adapted to our components?

    Yes – that's the standard. We work exclusively with your actual components, data, and measurement strategies.

  • Are specific measurement programs also being created?

    Yes, upon request, we can jointly develop directly usable evaluation structures and templates in ZEISS Inspect.